Scanning Electron Microscopy

Instrument: FEI Inspect S with Oxford Instruments EDX detector

Scanning electron microscopy provides high resolution (≥ 100,000 x’s magnification) 3D images of samples of interest. This allows features of a sample to be visualised down to around the 10 nanometer scale.

A wide range of solid sample types can be used with SEM though all must be electrically-conductive either naturally or by pre-coating the sample with a conducting material (typically carbon or gold).

Following visualisation of a sample, features of interest can be quantified using software or the elemental composition of the sample may be determined by coupling the SEM to energy dispersive X-ray spectroscopy (EDX).

SEM is a powerful technique to support the characterisation of unknown samples or for sample confirmation.
Technical Detail
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Sample requirements